利用原子力顯微鏡研究神經突起表面剝離側向力的方法

// Method for AFM investigation of lateral forces required for the surface detachment of neurites

本研究測量耳蝸神經節神經突觸（neurites）對植入物表面的附著力｜利用原子力顯微鏡量化離體條件下剝離神經突觸所需的側向力，平均為2.47 ± 0.19奈牛頓（nN）｜發現附著力不受神經突觸長度或位置影響，有助提升神經植入物的穩定性設計。

// This study aimed to measure how strongly neurites from spiral ganglion neurons adhere to implant surfaces, which is important for cochlear implant connections. Using atomic force microscopy, researchers quantified the lateral force needed to detach neurites from precoated substrates in vitro. They found the average detachment force was 2.47 ± 0.19 nN and that this force was not significantly affected by factors like neurite length or position. These results provide key quantitative data on neurite adhesion to surfaces relevant for neural implant stability.

Published 2026年7月7日